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RESEARCH ARTICLE
Year : 2011  |  Volume : 23  |  Issue : 4  |  Page : 518-520

X-ray diffractometric and elemental analysis of sialolith, dental calculus and odontome


1 Professor, Department of Oral Pathology and Microbiology, Rungta College of Dental Sciences and Research, Bhilai, Chhattisgarh, India
2 Dean, Department of Oral Pathology, Government Dental College and Hospital, Nagpur, Maharashtra, India
3 Professor, Department of Oral Surgery. VYWS's Dental College, Amravati, Maharashtra, India
4 Professor, Department of Oral Pathology, Modem Dental College, Indore, Madhya Pradesh, India
5 Professor and Head, Department of Oral Medicine and Radiology, CDCRI, Rajnandgaon, Chhattisgarh, India

Correspondence Address:
Rajesh Vasant Gondhalekar
Professor, Department of Oral Pathology and Microbiology, 2nd Lane Radhanagar, Shivajinagar PO, Amravati Maharashtra
India
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Source of Support: None, Conflict of Interest: None


DOI: 10.5005/jp-journals-10011-1213

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We are living in a world of rapid change and technology which is increasingly used in medical practice, has increased our confidence in solving specific problems. Technology that serves the patent better rejuvenates the clinical and diagnostic accuracy.


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