Home About us Editorial board Ahead of print Current issue Archives Submit article Instructions Subscribe Search Contacts Login 
  • Users Online: 653
  • Home
  • Print this page
  • Email this page
Year : 2011  |  Volume : 23  |  Issue : 4  |  Page : 518-520

X-ray diffractometric and elemental analysis of sialolith, dental calculus and odontome

1 Professor, Department of Oral Pathology and Microbiology, Rungta College of Dental Sciences and Research, Bhilai, Chhattisgarh, India
2 Dean, Department of Oral Pathology, Government Dental College and Hospital, Nagpur, Maharashtra, India
3 Professor, Department of Oral Surgery. VYWS's Dental College, Amravati, Maharashtra, India
4 Professor, Department of Oral Pathology, Modem Dental College, Indore, Madhya Pradesh, India
5 Professor and Head, Department of Oral Medicine and Radiology, CDCRI, Rajnandgaon, Chhattisgarh, India

Correspondence Address:
Rajesh Vasant Gondhalekar
Professor, Department of Oral Pathology and Microbiology, 2nd Lane Radhanagar, Shivajinagar PO, Amravati Maharashtra
Login to access the Email id

Source of Support: None, Conflict of Interest: None

DOI: 10.5005/jp-journals-10011-1213

Rights and Permissions

We are living in a world of rapid change and technology which is increasingly used in medical practice, has increased our confidence in solving specific problems. Technology that serves the patent better rejuvenates the clinical and diagnostic accuracy.

Print this article     Email this article
 Next article
 Previous article
 Table of Contents

 Similar in PUBMED
   Search Pubmed for
   Search in Google Scholar for
 Related articles
 Citation Manager
 Access Statistics
 Reader Comments
 Email Alert *
 Add to My List *
 * Requires registration (Free)

 Article Access Statistics
    PDF Downloaded63    
    Comments [Add]    

Recommend this journal